Incident and transmitted light microscopes for science materials, inspection of semiconductor components, LCD displays and wafers, equipped with an intelligent brightfield / darkfield illumination concept. The microscope models with additionally integrated LED transmitted light expand the application options in the direction of complex composite materials.
- Tube type Siedentopf, swiveling
- Widefield oculars for spectacle wearers with diopter adjustment on both oculars
- CCIS® Plan Achromat & S-APO (PB free), DIN objectives
- Reversed coded nosepiece
- LED incident light illuminator with field and aperture diaphragm, with slots for polariser / analyser sliders
- With interchangeable illumination
- Motic LightTracer: Light memory, sleep mode (auto on-off), nosepiece LED light intensity and mode indicator
- Coaxial coarse and fine focusing system with tension adjustment
- Integrated power supply with sleep mode
- USB 2.0 for external camera power
Additional equipment depending on the model with bright field (transmitted light), segmentable dark field (reflected light), polarization (reflected light)
Scope of supply: Dust cover, power cord, allen key, screws for metal extension support
